Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11515121 | Electron beam device | Tomohiko Ogata, Hisaya Murakoshi, Noriyuki Kaneoka, Katsunori Onuki | 2022-11-29 |
| 11342211 | Wafer inspection apparatus and wafer inspection method | Akira Doi, Minoru Sasaki, Hironori Ogawa, Tomohiko Ogata, Yuko Okada | 2022-05-24 |