Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11342211 | Wafer inspection apparatus and wafer inspection method | Akira Doi, Minoru Sasaki, Masaki Hasegawa, Hironori Ogawa, Tomohiko Ogata | 2022-05-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11342211 | Wafer inspection apparatus and wafer inspection method | Akira Doi, Minoru Sasaki, Masaki Hasegawa, Hironori Ogawa, Tomohiko Ogata | 2022-05-24 |