Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11520232 | Film for application to three-dimensional sample, method for manufacturing same, and method for transferring fine pattern using same | — | 2022-12-06 |
| 11342211 | Wafer inspection apparatus and wafer inspection method | Akira Doi, Masaki Hasegawa, Hironori Ogawa, Tomohiko Ogata, Yuko Okada | 2022-05-24 |