Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11263737 | Defect classification and source analysis for semiconductor equipment | Kapil Sawlani, Richard A. Gottscho, Michal Danek, Keith Wells | 2022-03-01 |
KH
Keith J. Hansen
Overall (2022): #376,972 of 548,613Top 70%
1
Patents 2022