Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11379967 | Methods and systems for inspection of semiconductor structures with automatically generated defect features | Jacob George, Saravanan Paramasivam, Martin Plihal, Niveditha Lakshmi Narasimhan, Prasanti Uppaluri | 2022-07-05 |
| 11237119 | Diagnostic methods for the classifiers and the defects captured by optical tools | Martin Plihal, Erfan Soltanmohammadi, Saravanan Paramasivam, Ankit Jain, Prasanti Uppaluri +1 more | 2022-02-01 |