Issued Patents 2022
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11514357 | Nuisance mining for novel defect discovery | — | 2022-11-29 |
| 11379967 | Methods and systems for inspection of semiconductor structures with automatically generated defect features | Jacob George, Saravanan Paramasivam, Niveditha Lakshmi Narasimhan, Sairam Ravu, Prasanti Uppaluri | 2022-07-05 |
| 11379969 | Method for process monitoring with optical inspections | Prasanti Uppaluri, Saravanan Paramasivam | 2022-07-05 |
| 11237119 | Diagnostic methods for the classifiers and the defects captured by optical tools | Erfan Soltanmohammadi, Saravanan Paramasivam, Sairam Ravu, Ankit Jain, Prasanti Uppaluri +1 more | 2022-02-01 |