Issued Patents 2022
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11379967 | Methods and systems for inspection of semiconductor structures with automatically generated defect features | Jacob George, Martin Plihal, Niveditha Lakshmi Narasimhan, Sairam Ravu, Prasanti Uppaluri | 2022-07-05 |
| 11379969 | Method for process monitoring with optical inspections | Martin Plihal, Prasanti Uppaluri | 2022-07-05 |
| 11342628 | Battery pack array frames with integrated fastener housings | Steve Droste, Rajaram Subramanian, Kimberley King | 2022-05-24 |
| 11237119 | Diagnostic methods for the classifiers and the defects captured by optical tools | Martin Plihal, Erfan Soltanmohammadi, Sairam Ravu, Ankit Jain, Prasanti Uppaluri +1 more | 2022-02-01 |