Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11301983 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Yan Avniel, Sergey Khristo, Shimon Levi, Doron Girmonsky +1 more | 2022-04-12 |
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Mor Baram
Overall (2022): #324,843 of 548,613Top 60%
1
Patents 2022