Issued Patents 2022
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11520133 | Systems, devices and methods for automatic microscope focus | John B. Putman, Vadim Pinskiy, Denis Sharoukhov | 2022-12-06 |
| 11416711 | Defect detection system | Tonislav Ivanov, Denis Babeshko, Vadim Pinskiy, Andrew Sundstrom | 2022-08-16 |
| 11408829 | Macro inspection systems, apparatus and methods | John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2022-08-09 |
| 11409367 | Apparatus and method for manipulating objects with gesture controls | John B. Putman, Paul Roossin | 2022-08-09 |
| 11411293 | Fault protected signal splitter apparatus | John B. Putman, Damas Limoge, Michael Moskie, Jonathan Lee | 2022-08-09 |
| 11341617 | System, method and apparatus for macroscopic inspection of reflective specimens | John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2022-05-24 |
| 11333876 | Method and system for mapping objects on unknown specimens | John B. Putman, John Cruickshank, Julie Orlando, Adele Frankel, Brandon Scott | 2022-05-17 |
| 11294162 | Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel | John B. Putman, Vadim Pinskiy, Denis Sharoukhov | 2022-04-05 |
| 11294146 | Systems, devices, and methods for automatic microscopic focus | John B. Putman, Julie Orlando, Dylan Fashbaugh | 2022-04-05 |