Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11408829 | Macro inspection systems, apparatus and methods | Matthew C. Putman, John B. Putman, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2022-08-09 |
| 11341617 | System, method and apparatus for macroscopic inspection of reflective specimens | Matthew C. Putman, John B. Putman, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2022-05-24 |