DB

Denis Babeshko

NI Nanotronics Imaging: 1 patents #10 of 19Top 55%
📍 New York, NY: #904 of 2,998 inventorsTop 35%
🗺 New York: #4,032 of 12,227 inventorsTop 35%
Overall (2022): #476,504 of 548,613Top 90%
1
Patents 2022

Issued Patents 2022

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11416711 Defect detection system Tonislav Ivanov, Vadim Pinskiy, Matthew C. Putman, Andrew Sundstrom 2022-08-16