Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11520133 | Systems, devices and methods for automatic microscope focus | John B. Putman, Matthew C. Putman, Denis Sharoukhov | 2022-12-06 |
| 11416711 | Defect detection system | Tonislav Ivanov, Denis Babeshko, Matthew C. Putman, Andrew Sundstrom | 2022-08-16 |
| 11294162 | Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel | Matthew C. Putman, John B. Putman, Denis Sharoukhov | 2022-04-05 |