Issued Patents 2022
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11429020 | Method and apparatus for removing a particle from a photolithographic mask | Hans Hermann Pieper | 2022-08-30 |
| 11353478 | Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope | Gabriel Baralia, Rainer Becker, Kinga Kornilov, Hans Hermann Pieper | 2022-06-07 |
| 11262378 | Apparatus and method for examining and/or processing a sample | Michael Budach | 2022-03-01 |
| 11237185 | Apparatus and method for a scanning probe microscope | Ulrich Matejka | 2022-02-01 |
| 11237187 | Method and apparatus for examining a measuring tip of a scanning probe microscope | Kinga Kornilov, Markus Bauer | 2022-02-01 |