Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11353478 | Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope | Gabriel Baralia, Rainer Becker, Christof Baur, Hans Hermann Pieper | 2022-06-07 |
| 11237187 | Method and apparatus for examining a measuring tip of a scanning probe microscope | Christof Baur, Markus Bauer | 2022-02-01 |