CC

Chung-Liang Cheng

TSMC: 17 patents #90 of 3,494Top 3%
Overall (2021): #2,821 of 548,734Top 1%
17
Patents 2021

Issued Patents 2021

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
11183574 Work function layers for transistor gate electrodes Ziwei Fang, Chun-I Wu, Huang-Lin Chao 2021-11-23
11177259 Multi-threshold gate structure with doped gate dielectric layer I-Ming Chang, Ziwei Fang, Huang-Lin Chao 2021-11-16
11164796 Method for forming semiconductor device structure Ziwei Fang 2021-11-02
11127832 Semiconductor structure and method for forming the same Ziwei Fang 2021-09-21
11088034 Gate structures for semiconductor devices Ziwei Fang 2021-08-10
11062908 Contact structure Hong-Ying Lin, Cheng-Yi Wu, Alan Tu, Li-Hsuan Chu, Ethan Hsiao +6 more 2021-07-13
11049937 Gate structures for semiconductor devices Chun-I Wu, Huang-Lin Chao 2021-06-29
11038029 Semiconductor device structure and method for forming the same Hsueh Wen Tsau, Chun-I Wu, Ziwei Fang, Huang-Lin Chao, I-Ming Chang +1 more 2021-06-15
11031291 Semiconductor structure and method of forming the same I-Ming Chang, Hsiang-Pi Chang, Hung-Chang Sun, Yao-Sheng Huang, Yu-Wei Lu +3 more 2021-06-08
10985265 Method for forming semiconductor device structure I-Ming Chang, Hsiang-Pi Chang, Hsueh Wen Tsau, Ziwei Fang, Huang-Lin Chao 2021-04-20
10985022 Gate structures having interfacial layers Chun-I Wu, Ziwei Fang, Huang-Lin Chao 2021-04-20
10978357 Semiconductor arrangement and method of manufacture I-Ming Chang, Hsiang-Pi Chang, Hsueh Wen Tsau, Ziwei Fang 2021-04-13
10971402 Semiconductor device including interface layer and method of fabricating thereof I-Ming Chang, Hsiang-Pi Chang, Yu-Wei Lu, Ziwei Fang, Huang-Lin Chao 2021-04-06
10964792 Dual metal capped via contact structures for semiconductor devices Ziwei Fang 2021-03-30
10930495 Integrated circuits with doped gate dielectrics Yen-Yu Chen 2021-02-23
10923416 Interconnect structure with insulation layer and method of forming the same Shih Wei Bih, Yen-Yu Chen 2021-02-16
10923393 Contacts and interconnect structures in field-effect transistors Ziwei Fang 2021-02-16