Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11150269 | Probe head for high frequency signal test and medium or low frequency signal test at the same time | Hui-Pin Yang, Shang-Jung Hsieh, Yu-Wen Chou, Huo-Kang Hsu, Chin-Tien Yang | 2021-10-19 |
| 10955746 | Lithography method with reduced impacts of mask defects | Shinn-Sheng Yu, Wen-Chuan Wang, Ting-Hao Hsu, Sheng-Chi Chin, Anthony Yen | 2021-03-23 |