Issued Patents 2021
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11195416 | System, management method, and information processing device for determination of parking position of vehicle | — | 2021-12-07 |
| 11170483 | Sample observation device and sample observation method | Minoru Harada, Naoaki KONDO, Takehiro Hirai | 2021-11-09 |
| 11087454 | Defect observation device and defect observation method | Naoaki KONDO, Minoru Harada, Takehiro Hirai | 2021-08-10 |
| 10996569 | Measurement device, method and display device | Fumihiko Fukunaga, Yasunori Goto | 2021-05-04 |
| 10977786 | Wafer observation device | Naoaki KONDO, Minoru Harada, Takehiro Hirai | 2021-04-13 |
| 10971325 | Defect observation system and defect observation method for semiconductor wafer | Minoru Harada, Naoaki KONDO, Takehiro Hirai, Yohei Minekawa | 2021-04-06 |