Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11054252 | Thickness measurement method, thickness measurement device, defect detection method, and defect detection device | Hirotsugu Inoue, Shogo Tokunaga, Yu KUROKAWA, Takuya Niioka | 2021-07-06 |
| 10900844 | Stress distribution measurement method and stress distribution measurement system | Ryoji Hirose | 2021-01-26 |