Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11054252 | Thickness measurement method, thickness measurement device, defect detection method, and defect detection device | Yousuke Irie, Hirotsugu Inoue, Yu KUROKAWA, Takuya Niioka | 2021-07-06 |