Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11054252 | Thickness measurement method, thickness measurement device, defect detection method, and defect detection device | Yousuke Irie, Shogo Tokunaga, Yu KUROKAWA, Takuya Niioka | 2021-07-06 |
| 10945367 | Combine having a temporary retention unit and a shutter | Kazuhiro Takahara, Hiroshi Ikeda, Kazunori Matsufuji, Katsuhide Kato | 2021-03-16 |
| 10905046 | Combine | Kazuhiro Takahara, Hiroshi Ikeda | 2021-02-02 |