{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "2021", "item": "https://www.patentleaderboard.com/2021/"}, {"@type": "ListItem", "position": 3, "name": "Nova", "item": "https://www.patentleaderboard.com/2021/company/nova"}, {"@type": "ListItem", "position": 4, "name": "Michael Shifrin", "item": "https://www.patentleaderboard.com/2021/inventor/fl:mi_ln:shifrin-2"}]}
Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Michael Shifrin — 1 Patent in 2021

NINova Measuring Instruments: 1 patents #4 of 42Top 10%
Ashkelon, IL: #20 of 49 inventorsTop 45%
Overall (2021): #328,178 of 548,734Top 60%
1 Patents 2021

Issued Patents 2021

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
10916404 TEM-based metrology method and system Vladimir Machavariani, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more 2021-02-09 $17,692,000