Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10916404 | TEM-based metrology method and system | Vladimir Machavariani, Michael Shifrin, Daniel Kandel, Victor Kucherov, Ronen Urenski +1 more | 2021-02-09 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10916404 | TEM-based metrology method and system | Vladimir Machavariani, Michael Shifrin, Daniel Kandel, Victor Kucherov, Ronen Urenski +1 more | 2021-02-09 |