Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10916404 | TEM-based metrology method and system | Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2021-02-09 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10916404 | TEM-based metrology method and system | Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2021-02-09 |