Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10997345 | Method of etch model calibration using optical scatterometry | Ye Feng, Marcus Musselman, Andrew D. Bailey, III, Mehmet Derya Tetiker, Saravanapriyan Sriraman +1 more | 2021-05-04 |
YZ
Yan Zhang
Overall (2021): #203,846 of 548,734Top 40%
1
Patents 2021