Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11139216 | System, method and non-transitory computer readable medium for tuning sensitivities of, and determining a process window for, a modulated wafer | David Craig Oram, Abhinav Mathur, Eugene Shifrin | 2021-10-05 |
| 11067516 | High accuracy of relative defect locations for repeater analysis | Shishir Suman, Hong Chen | 2021-07-20 |
| 10923317 | Detecting defects in a logic region on a wafer | Junqing Huang, Paul Russell, Hucheng Lee | 2021-02-16 |