Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10923317 | Detecting defects in a logic region on a wafer | Junqing Huang, Hucheng Lee, Kenong Wu | 2021-02-16 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10923317 | Detecting defects in a logic region on a wafer | Junqing Huang, Hucheng Lee, Kenong Wu | 2021-02-16 |