Issued Patents 2021
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11183359 | Charged particle beam apparatus | Kenichi Nishinaka | 2021-11-23 |
| 11164716 | Charged particle beam device | Shunichi Motomura, Tadahiro Kawasaki, Takeharu Kato, Ryuji Yoshida | 2021-11-02 |
| 11143606 | Particle measuring device and particle measuring method | Tomihiro Hashizume, Masatoshi Yasutake, Takafumi Miwa | 2021-10-12 |
| 11107656 | Charged particle beam device | Shunichi Motomura, Kenichi Nishinaka, Toshihide Agemura | 2021-08-31 |
| 11067391 | Charged particle beam device and sample thickness measurement method | Takahiro Sato | 2021-07-20 |
| 10886101 | Charged particle beam device | Ryo HIRANO, Hideo Morishita, Toshihide Agemura, Junichi Katane | 2021-01-05 |