Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11143601 | Test structure design for metrology measurements in patterned samples | Gilad Barak, Igor Turovets | 2021-10-12 |
| 11093840 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more | 2021-08-17 |
| 10942439 | Real-time tracking for three-dimensional imaging | Vardit Eckhouse, Igor Altman | 2021-03-09 |