Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 11143601 | Test structure design for metrology measurements in patterned samples | Gilad Barak, Oded Cohen | 2021-10-12 | |
| 10978321 | Method and system for processing patterned structures | — | 2021-04-13 | $9,922,000 |