{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "2021", "item": "https://www.patentleaderboard.com/2021/"}, {"@type": "ListItem", "position": 3, "name": "Nova Measuring Instruments", "item": "https://www.patentleaderboard.com/2021/company/nova-measuring-instruments"}, {"@type": "ListItem", "position": 4, "name": "Igor Turovets", "item": "https://www.patentleaderboard.com/2021/inventor/fl:ig_ln:turovets-1"}]}
Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
IT

Igor Turovets — 2 Patents in 2021

NINova Measuring Instruments: 1 patents #4 of 42Top 10%
Mevaseret Tsiyon, IL: #5 of 33 inventorsTop 20%
Overall (2021): #154,363 of 548,734Top 30%
2 Patents 2021

Issued Patents 2021

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
11143601 Test structure design for metrology measurements in patterned samples Gilad Barak, Oded Cohen 2021-10-12
10978321 Method and system for processing patterned structures 2021-04-13 $9,922,000