Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11143601 | Test structure design for metrology measurements in patterned samples | Gilad Barak, Oded Cohen | 2021-10-12 |
| 10978321 | Method and system for processing patterned structures | — | 2021-04-13 |