Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 11093840 | Metrology and process control for semiconductor manufacturing | Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim, ARIEL BROITMAN +5 more | 2021-08-17 | $19,081,000 |