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EITAN ROTHSTEIN

NI Nova Measuring Instruments: 1 patents #4 of 42Top 10%
Overall (2021): #466,582 of 548,734Top 90%
1
Patents 2021

Issued Patents 2021

Patent #TitleCo-InventorsDate
11093840 Metrology and process control for semiconductor manufacturing Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim, ARIEL BROITMAN +5 more 2021-08-17