Issued Patents 2021
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11143598 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Masami Makuuchi, Yuta Urano, Keiko Oka | 2021-10-12 |
| 11143600 | Defect inspection device | Toshifumi Honda, Masami Makuuchi, Akira Hamamatsu, Nobuhiro Obara | 2021-10-12 |
| 11047805 | Inspection device and detector | — | 2021-06-29 |
| 10918293 | Magnetic measuring apparatus | Takumi Yamaga, Hiroshi Deguchi, Koji Yamaguchi, Takafumi Ishibe, Shigenori Kawabata +1 more | 2021-02-16 |