Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11199511 | Medium sensor device and monitoring system | Kazuki Ikeda, Shinichi Murakami, Ryo Kadoi, Tomoharu NAGASHIMA | 2021-12-14 |
| 11143598 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Shunichi Matsumoto, Yuta Urano, Keiko Oka | 2021-10-12 |
| 11143600 | Defect inspection device | Toshifumi Honda, Shunichi Matsumoto, Akira Hamamatsu, Nobuhiro Obara | 2021-10-12 |