YD

Yuchen Deng

FE Fei: 3 patents #4 of 110Top 4%
Overall (2021): #55,983 of 548,734Top 15%
3
Patents 2021

Issued Patents 2021

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
11183364 Dual beam microscope system for imaging during sample processing Petrus Hubertus Franciscus Trompenaars, Bart Buijsse, Alexander Henstra 2021-11-23
10937625 Method of imaging a sample using an electron microscope Erik Franken, Remco Schoenmakers, Bart Jozef Janssen, Martin Verheijen, Holger Kohr +1 more 2021-03-02
10923308 Method and system for energy resolved chroma imaging Peter Christiaan Tiemeijer, Holger Kohr, Jaydeep Sanjay Belapure 2021-02-16