Yuchen Deng — 3 Patents at Fei

Issued Patents 2021

Showing 1–3 of 3 patents

Patent #	Title	Co-Inventors	Date
11183364	Dual beam microscope system for imaging during sample processing	Petrus Hubertus Franciscus Trompenaars, Bart Buijsse, Alexander Henstra	2021-11-23
10937625	Method of imaging a sample using an electron microscope	Erik Franken, Remco Schoenmakers, Bart Jozef Janssen, Martin Verheijen, Holger Kohr +1 more	2021-03-02
10923308	Method and system for energy resolved chroma imaging	Peter Christiaan Tiemeijer, Holger Kohr, Jaydeep Sanjay Belapure	2021-02-16