EF

Erik Franken

FE Fei: 2 patents #16 of 110Top 15%
📍 Nuenen, NL: #2 of 20 inventorsTop 10%
Overall (2021): #164,033 of 548,734Top 30%
2
Patents 2021

Issued Patents 2021

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
11151356 Using convolution neural networks for on-the-fly single particle reconstruction John Flanagan, Maurice Peemen 2021-10-19
10937625 Method of imaging a sample using an electron microscope Remco Schoenmakers, Bart Jozef Janssen, Martin Verheijen, Holger Kohr, Yuchen Deng +1 more 2021-03-02