BB

Bart Buijsse

FE Fei: 4 patents #1 of 110Top 1%
Overall (2021): #53,636 of 548,734Top 10%
4
Patents 2021

Issued Patents 2021

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
11183364 Dual beam microscope system for imaging during sample processing Yuchen Deng, Petrus Hubertus Franciscus Trompenaars, Alexander Henstra 2021-11-23
11101101 Laser-based phase plate image contrast manipulation Bas Hendriksen, Pleun Dona 2021-08-24
11004655 Diffraction pattern detection in a transmission charged particle microscope Maarten Kuijper 2021-05-11
10935506 Method and system for determining molecular structure Abhay Kotecha 2021-03-02