Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11183364 | Dual beam microscope system for imaging during sample processing | Yuchen Deng, Petrus Hubertus Franciscus Trompenaars, Bart Buijsse | 2021-11-23 |
| 11114271 | Sixth-order and above corrected STEM multipole correctors | Peter Christiaan Tiemeijer, Marcel Niestadt | 2021-09-07 |