Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11073487 | Methods and systems for characterization of an x-ray beam with high spatial resolution | Nikolay Artemiev, Joseph A. Di Regolo, Antonio Arion Gellineau, Alexander Kuznetsov, Andrei Veldman +1 more | 2021-07-27 |
| 10959318 | X-ray metrology system with broadband laser produced plasma illuminator | Oleg Khodykin | 2021-03-23 |