Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10879135 | Overlay error and process window metrology | Shang-Wei Fang, Jing-Sen Wang, Yuan-Yao Chang, Ting-Hua Hsieh, Pei-Hsuan Lee +1 more | 2020-12-29 |
WL
Wei-Ray Lin
Overall (2020): #228,054 of 565,922Top 45%
1
Patents 2020