Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10879135 | Overlay error and process window metrology | Jing-Sen Wang, Yuan-Yao Chang, Wei-Ray Lin, Ting-Hua Hsieh, Pei-Hsuan Lee +1 more | 2020-12-29 |
SF
Shang-Wei Fang
Overall (2020): #277,749 of 565,922Top 50%
1
Patents 2020