Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10535573 | System and method for test key characterizing wafer processing state | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih | 2020-01-14 |
WT
Wei-Chun Tsai
Overall (2020): #227,424 of 565,922Top 45%
1
Patents 2020