Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10871518 | Systems and methods for determining systematic defects | Sandeep Kumar Goel, Yun-Han Lee | 2020-12-22 |
| 10685157 | Power-aware scan partitioning | Sandeep Kumar Goel, Yun-Han Lee | 2020-06-16 |