Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876977 | Inspection management system, inspection management apparatuses, and inspection management method | Hiroyuki Mori, Katsuki Nakajima, Mayuko Tanaka, Isao Nakanishi | 2020-12-29 |
| 10605748 | X-ray inspection apparatus and X-ray inspection method | Shinji Sugita, Yuji Umemoto | 2020-03-31 |
| 10545101 | Inspection apparatus | Shinji Sugita, Yoshihide Ota | 2020-01-28 |