Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10605748 | X-ray inspection apparatus and X-ray inspection method | Yuji Umemoto, Takako Onishi | 2020-03-31 |
| 10545101 | Inspection apparatus | Takako Onishi, Yoshihide Ota | 2020-01-28 |