Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10861709 | Method of evaluating impurity gettering capability of epitaxial silicon wafer and epitaxial silicon wafer | Ryosuke OKUYAMA, Kazunari Kurita | 2020-12-08 |
| 10853959 | Optical inspection tool and method | Yasuhiro Yoshitake, Taiki Murata | 2020-12-01 |
| 10766347 | Vehicle battery mounting structure | Makoto Iwasa, Hidetoshi Kadota, Tadayoshi Hashimura, Nobuhiro Mori, Kentaro Hatta | 2020-09-08 |
| 10602407 | Radio network system | Hiroyuki Uzawa, Yuki Arikawa, Kenji Kawai | 2020-03-24 |