Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10861709 | Method of evaluating impurity gettering capability of epitaxial silicon wafer and epitaxial silicon wafer | Satoshi Shigematsu, Kazunari Kurita | 2020-12-08 |
| 10629648 | Method of producing semiconductor epitaxial wafer, semiconductor epitaxial wafer, and method of producing solid-state image sensor | — | 2020-04-21 |