Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852344 | Inductive testing probe apparatus for testing semiconductor die and related systems and methods | Tony M. Lindenberg, Kurt J. Bossart, Jonathan S. Hacker | 2020-12-01 |
| 10790251 | Methods for enhancing adhesion of three-dimensional structures to substrates | Christopher J. Gambee, Nhi Doan, Owen R. Fay, Ying Chen | 2020-09-29 |