Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10679819 | Aberration correcting device for an electron microscope and an electron microscope comprising such a device | — | 2020-06-09 |
| RE48046 | Lithography system, sensor and measuring method | Erwin Slot, Tijs Frans Teepen, Marco Jan-Jaco Wieland, Stijn Willem Herman Karel Steenbrink | 2020-06-09 |
| 10651009 | Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope | Jacob Pieter Hoogenboom, Nalan Liv Hamarat | 2020-05-12 |