Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10651009 | Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope | Nalan Liv Hamarat, Pieter Kruit | 2020-05-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10651009 | Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope | Nalan Liv Hamarat, Pieter Kruit | 2020-05-12 |