Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10777377 | Multi-column spacing for photomask and reticle inspection and wafer print check verification | Robert Haynes, Moshe E. Preil | 2020-09-15 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10777377 | Multi-column spacing for photomask and reticle inspection and wafer print check verification | Robert Haynes, Moshe E. Preil | 2020-09-15 |