Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10777377 | Multi-column spacing for photomask and reticle inspection and wafer print check verification | Robert Haynes, Frank Chilese | 2020-09-15 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10777377 | Multi-column spacing for photomask and reticle inspection and wafer print check verification | Robert Haynes, Frank Chilese | 2020-09-15 |